X-ray multispectral CT can obtain more measurement information of the measured object and has better material discrimination ability. In order to further improve the quality of CT imaging and enhance spatial resolution, it is necessary to combine the physical and mathematical statistical models of CT systems to establish a more realistic CT data measurement model and develop efficient solving algorithms for multispectral CT. This talk focuses on the recent development of high-resolution image reconstruction methods for multispectral CT and related equipment based on physical models by the Beijing Inspection and Imaging Engineering Center of Capital Normal University.